Degradation of electrical performance and floating body effect in ultra thin gate oxide FD-SOI n-MOSFETs by 7.5-MeV proton irradiation. - Kiyoteru Hayama; Kenichiro Takakura; Hidenori Ohyama; Abdelkarim Mercha; Eddy Simoen; Cor Claeys; Joan Marc Rafí; Michael Kokkoris (Microelectron. Reliab., 2004)

Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs. - Kiyoteru Hayama; Kenichiro Takakura; Hidenori Ohyama; S. Kuboyama; S. Matsuda; Joan Marc Rafí; Abdelkarim Mercha; Eddy Simoen; Cor Claeys (Microelectron. Reliab., 2005)

Impact on the back gate degradation in partially depleted SOI n-MOSFETs by 2-MeV electron irradiation. - Kiyoteru Hayama; Kenichiro Takakura; K. Shigaki; Hidenori Ohyama; Joan Marc Rafí; Abdelkarim Mercha; Eddy Simoen; Cor Claeys (Microelectron. Reliab., 2006)

2 MeV electron irradiation effects on the electrical characteristics of MOS capacitors with ALD Al2O3 dielectrics of different thickness. - Joan Marc Rafí; M. B. González; Kenichiro Takakura; I. Tsunoda; M. Yoneoka; Oihane Beldarrain; Miguel Zabala; Francesca Campabadal (Microelectron. Reliab., 2013)

Puddle Detection for Avoidance Path Planning of Wheeled Mobile Robot Using Laser Reflection Intensity. - Hirotaka Tahara; Ibuki Ikegami; Kenichiro Takakura; Tatsuya Kato; Masanobu Nagata (IECON, 2019)

Assessment of Radiation Tolerance of Flash Memory by γ-Ray Irradiation. - Kenichiro Takakura; Kensuke Matsumoto; Kousei Tateishi; Masashi Yoneoka; Isao Tsunoda; Shigekazu Suzuki; Shinji Kawatsuma (J. Robotics Mechatronics, 2024)