Large Suppression to Lateral Charge Migration (LCM) Related Error Bits in Charge-Trap TLC 3D NAND Flash. - Kenie Xie; Pena Guo; Fei Chen; Binglu Chen; Xiaotong Fang; Jixuan Wu; Xuepeng Zhan; Jiezhi Chen (ICTA, 2022)

One-shot Read Processing to Enhance Cold Data Retention in Charge-trap TLC 3D NAND Flash. - Shaoqi Yang; Xiaohuan Zhao; Kenie Xie; Xuepeng Zhan; Jixuan Wu; Jiezhi Chen (ASICON, 2023)

Error Bits Recovering in 3D NAND Flash Memory: A Novel State-Shift Re-Program (SRP) Scheme. - Xiaohuan Zhao; Shaoqi Yang; Kenie Xie; Yang Feng; Qianwen Wang; Pengpeng Sang; Xuepeng Zhan; Jixuan Wu; Jiezhi Chen (ICTA, 2023)