VLSI reliability challenges: from device physics to wafer scale systems. - Eiji Takeda; Kunihiko Ikuzaki; Hisao Katto; Yuzuru Ohji; Kenji Hinode; Akemi Hamada; Toshiyuki Sakuta; Takahiro Funabiki; Toshio Sasaki (Proc. IEEE, 1993)

Reliability issues of silicon LSIs facing 100-nm technology node. - Eiji Takeda; Eiichi Murakami; Kazuyoshi Torii; Yutaka Okuyama; Eishi Ebe; Kenji Hinode; Shin'ichiro Kimura (Microelectron. Reliab., 2002)

Superconductive Single-Flux-Quantum Circuit/System Technology and 40Gb/s Switch System Demonstration. - Yoshihito Hashimoto; Shuichi Nagasawa; Tetsuro Satoh; Kenji Hinode; Hideo Suzuki; Toshiyuki Miyazaki; Mutsuo Hidaka; Nobuyuki Yoshikawa; Hirotaka Terai; Akira Fujimaki (ISSCC, 2008)

Improvements in Fabrication Process for Nb-Based Single Flux Quantum Circuits in Japan. - Mutsuo Hidaka; Shuichi Nagasawa; Kenji Hinode; Tetsuro Satoh (IEICE Trans. Electron., 2008)

Nb 9-Layer Fabrication Process for Superconducting Large-Scale SFQ Circuits and Its Process Evaluation. - Shuichi Nagasawa; Kenji Hinode; Tetsuro Satoh; Mutsuo Hidaka; Hiroyuki Akaike; Akira Fujimaki; Nobuyuki Yoshikawa; Kazuyoshi Takagi; Naofumi Takagi (IEICE Trans. Electron., 2014)