Reliability analysis of InGaN Blu-Ray laser diode. - Nicola Trivellin; Matteo Meneghini; Gaudenzio Meneghesso; Enrico Zanoni; Kenji Orita; Masaaki Yuri; Tsuyoshi Tanaka; Daisuke Ueda (Microelectron. Reliab., 2009)

Reliability evaluation for Blu-Ray laser diodes. - Matteo Meneghini; Nicola Trivellin; Kenji Orita; Masaaki Yuri; Tsuyoshi Tanaka; Daisuke Ueda; Enrico Zanoni; Gaudenzio Meneghesso (Microelectron. Reliab., 2010)

Degradation of InGaN lasers: Role of non-radiative recombination and injection efficiency. - Nicola Trivellin; Matteo Meneghini; Carlo De Santi; Simone Vaccari; Gaudenzio Meneghesso; Enrico Zanoni; Kenji Orita; S. Takigawa; Tsuyoshi Tanaka; Daisuke Ueda (Microelectron. Reliab., 2011)