Intelligent Fault Analysis Decision Flow in Semiconductor Industry 4.0 Using Natural Language Processing with Deep Clustering. - Kenneth Ezukwoke; Houari Toubakh; Anis Hoayek; Mireille Batton-Hubert; Xavier Boucher; Pascal Gounet (CASE, 2021)

NLP based on GCVAE for intelligent Fault Analysis in Semiconductor industry. - Zhiqiang Wang; Kenneth Ezukwoke; Anis Hoayek; Mireille Batton-Hubert; Xavier Boucher (ETFA, 2022)

GCVAE: Generalized-Controllable Variational AutoEncoder. - Kenneth Ezukwoke; Anis Hoayek; Mireille Batton-Hubert; Xavier Boucher (CoRR, 2022)

Leveraging Pre-trained Models for Failure Analysis Triplets Generation. - Kenneth Ezukwoke; Anis Hoayek; Mireille Batton-Hubert; Xavier Boucher; Pascal Gounet; Jérôme Adrian (CoRR, 2022)

Unsupervised approach for an optimal representation of the latent space of a failure analysis dataset. - Abbas Rammal; Kenneth Ezukwoke; Anis Hoayek; Mireille Batton-Hubert (J. Supercomput., 2024)

Natural language processing (NLP) and association rules (AR)-based knowledge extraction for intelligent fault analysis: a case study in semiconductor industry. - Zhiqiang Wang; Kenneth Ezukwoke; Anis Hoayek; Mireille Batton-Hubert; Xavier Boucher (J. Intell. Manuf., 2025)

Correction: Natural language processing (NLP) and association rules (AR)-based knowledge extraction for intelligent fault analysis: a case study in semiconductor industry. - Zhiqiang Wang; Kenneth Ezukwoke; Anis Hoayek; Mireille Batton-Hubert; Xavier Boucher (J. Intell. Manuf., 2025)

Big GCVAE: decision-making with adaptive transformer model for failure root cause analysis in semiconductor industry. - Kenneth Ezukwoke; Anis Hoayek; Mireille Batton-Hubert; Xavier Boucher; Pascal Gounet; Jérôme Adrian (J. Intell. Manuf., 2025)