A generalized model for the lifetime of microelectronic components, applied to storage conditions. - Loren J. Wise; Ronald D. Schrimpf; Harold G. Parks; Kenneth F. Galloway (Microelectron. Reliab., 2001)

Single event burnout in power diodes: Mechanisms and models. - A. M. Albadri; Ronald D. Schrimpf; Kenneth F. Galloway; D. Greg Walker (Microelectron. Reliab., 2006)