A General Purpose IDDQ Measurement Circuit. - Kenneth M. Wallquist; Alan W. Righter; Charles F. Hawkins (ITC, 1993)

On the Effect of ISSQ Testing in Reducing Early Failure Rate. - Kenneth M. Wallquist (ITC, 1995)

Achieving IDDQ/ISSQ Production Testing with QuiC-Mon. - Kenneth M. Wallquist (IEEE Des. Test Comput., 1995)