Probabilistic Treatment of General Combinational Networks. - Kenneth P. Parker; Edward J. McCluskey (IEEE Trans. Computers, 1975)

Analysis of Logic Circuits with Faults Using Input Signal Probabilities. - Kenneth P. Parker; Edward J. McCluskey (IEEE Trans. Computers, 1975)

Boolean Network Probabilities and Network Design. - Edward J. McCluskey; Kenneth P. Parker; John J. Shedletsky (IEEE Trans. Computers, 1978)

Sequential Circuit Output Probabilities From Regular Expressions. - Kenneth P. Parker; Edward J. McCluskey (IEEE Trans. Computers, 1978)

Testing Logic Networks and Designing for Testability. - Thomas W. Williams; Kenneth P. Parker (Computer, 1979)

Design for Testability - A Survey. - Thomas W. Williams; Kenneth P. Parker (IEEE Trans. Computers, 1982)

Testability: Barriers to Acceptance. - Kenneth P. Parker (IEEE Des. Test, 1986)

The impact of boundary scan on board test. - Kenneth P. Parker (IEEE Des. Test, 1989)

A language for describing boundary scan devices. - Kenneth P. Parker; Stig Oresjo (J. Electron. Test., 1991)

Structure and Metrology for an Analog Testability Bus. - Kenneth P. Parker; John E. McDermid; Stig Oresjo (ITC, 1993)

Observations on the 1149.x Family of Standards. - Kenneth P. Parker (ITC, 1994)

The ITC Lecture Series: An Experiment. - Kenneth P. Parker; David Greene (ITC, 1995)

IEEE Std 1149.1: Where Are We? Where From Here? - Mick Tegethoff; Kenneth P. Parker (IEEE Des. Test Comput., 1995)

Introduction ITC 1996 Lecture Series on Unpowered Opens Testing. - Kenneth P. Parker (ITC, 1996)

Opens Board Test Coverage: When is 99% Really 40%? - Mick Tegethoff; Kenneth P. Parker; Ken Lee (ITC, 1996)

Design, Fabrications and Use of Mixed-Signal IC Testability Structures. - Kenneth P. Parker; John E. McDermid; Rodney A. Browen; Kozo Nuriya; Katsuhiro Hirayama; Akira Matsuzawa (ITC, 1997)

System issues in boundary-scan board test. - Kenneth P. Parker (ITC, 2000)

Frequency detection-based boundary-scan testing of AC coupled nets. - Young Kim; Benny Lai; Kenneth P. Parker; Jeff Rearick (ITC, 2001)

IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks. - Bill Eklow; Carl Barnhart; Kenneth P. Parker (ITC, 2002)

Test Coverage: What Does It Mean When a Board Test Passes?. - Kathy Hird; Kenneth P. Parker; Bill Follis (ITC, 2002)

Board Test Is NOT Mature. - Kenneth P. Parker (ITC, 2002)

Defect Coverage of Boundary-Scan Tests: What does it mean when a Boundary-Scan test passes? - Kenneth P. Parker (ITC, 2003)

IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks. - Bill Eklow; Carl Barnhart; Kenneth P. Parker (IEEE Des. Test Comput., 2003)

Testing for what? - Kenneth P. Parker (IEEE Des. Test Comput., 2003)

A New Probing Technique for High-Speed/High-Density Printed Circuit Boards. - Kenneth P. Parker (ITC, 2004)

Board Test Coverage Needs to be Standardized. - Kenneth P. Parker (ITC, 2004)

The effects of defects on high-speed boards. - Kenneth P. Parker (ITC, 2005)

Bead probes in practice. - Kenneth P. Parker (ITC, 2005)

A bead probe CAD strategy for in-circuit test. - Kenneth P. Parker; Don DeMille (ITC, 2007)

Finding power/ground defects on connectors - a new approach. - Kenneth P. Parker; Stephen Hird (ITC, 2007)

Augmenting Boundary-Scan Tests for Enhanced Defect Coverage. - Dayton Norrgard; Kenneth P. Parker (ITC, 2008)

Boundary-Scan Testing of Power/Ground Pins. - Kenneth P. Parker; Neil G. Jacobson (ITC, 2008)

An outlier detection based approach for PCB testing. - Xin He; Yashwant K. Malaiya; Anura P. Jayasumana; Kenneth P. Parker; Stephen Hird (ITC, 2009)

What is IEEE P1149.8.1 and why? - Kenneth P. Parker; Jeff Burgess (ITC, 2009)

Testing bridges to nowhere - combining Boundary Scan and capacitive sensing. - Steve Sunter; Kenneth P. Parker (ITC, 2009)

Solutions for undetected shorts on IEEE 1149.1 self-monitoring pins. - C. J. Clark; Dave Dubberke; Kenneth P. Parker; Bill Tuthill (ITC, 2010)

Principal Component Analysis-based compensation for measurement errors due to mechanical misalignments in PCB testing. - Xin He; Yashwant K. Malaiya; Anura P. Jayasumana; Kenneth P. Parker; Stephen Hird (ITC, 2010)

Surviving state disruptions caused by test: The "Lobotomy Problem". - Kenneth P. Parker (ITC, 2010)

Surviving state disruptions caused by test: A case study. - Kenneth P. Parker; Shuichi Kameyama; David Dubberke (ITC, 2011)

Capacitive sensing testability in complex memory devices. - Kenneth P. Parker (ITC, 2012)