Cross-Coupled Charge-Transfer Sense Amplifier and Latch Sense Scheme for High-Density FET Memories. - Kenneth S. Gray (IBM J. Res. Dev., 1980)

A 576 K 3.5-ns access BiCMOS ECL static RAM with array built-in self-test. - Henry A. Bonges III; R. Dean Adams; Archibald J. Allen; Roy Flaker; Kenneth S. Gray; Erik L. Hedberg; W. Timothy Holman; George M. Lattimore; David A. Lavalette; Kim Yen T. Nguyen; Alan L. Roberts (IEEE J. Solid State Circuits, 1992)