A novel design of grating projecting system for 3D reconstruction of wafer bumps. - Shu Yuan; Ronald Chung; Tan Zheng; Jun Cheng 002; Edmund Y. Lam; Kenneth S. M. Fung; Fan Wang (Three-Dimensional Image Capture and Applications, 2006)

Bit-pairing Codification for Binary Pattern Projection System. - Jun Cheng 002; Ronald Chung; Edmund Y. Lam; Kenneth S. M. Fung (ICPR (2), 2006)

Use of Paraplanar Constraint for Parallel Inspection of Wafer Bump Heights. - Mei Dong; Ronald Chung; Edmund Y. Lam; Kenneth S. M. Fung (IPCV, 2007)

Optimization of Bit-Pairing Codification with Learning for 3D Reconstruction. - Jun Cheng 002; Ronald Chung; Edmund Y. Lam; Kenneth S. M. Fung; Yangsheng Xu (Int. J. Image Graph., 2007)

Handling of multi-reflections in wafer bump 3D reconstruction. - Jun Cheng 002; Ronald Chung; Edmund Y. Lam; Kenneth S. M. Fung (SMC, 2008)

Reference-Free Machine Vision Inspection of semiconductor die Images. - Ada N. Y. Ng; Edmund Y. Lam; Ronald Chung; Kenneth S. M. Fung; W. H. Leung (Int. J. Image Graph., 2009)

EC-EGI: enriched complex EGI for 3D shape registration. - Zhaozheng Hu; Ronald Chung; Kenneth S. M. Fung (Mach. Vis. Appl., 2010)

An illumination-invariant phase-shifting algorithm for three-dimensional profilometry. - Fuqin Deng; Chang Liu; Wuifung Sze; Jiangwen Deng; Kenneth S. M. Fung; W. H. Leung; Edmund Y. Lam (Image Processing: Machine Vision Applications, 2012)

An elliptic phase-shift algorithm for high speed three-dimensional profilometry. - Fuqin Deng; Zhao Li; Jia Chen; Jiangwen Deng; Kenneth S. M. Fung; Edmund Y. Lam (Image Processing: Machine Vision Applications, 2013)

A polynomial phase-shift algorithm for high precision three-dimensional profilometry. - Fuqin Deng; Chang Liu; Wuifung Sze; Jiangwen Deng; Kenneth S. M. Fung; Edmund Y. Lam (Image Processing: Machine Vision Applications, 2013)

An edge-from-focus approach to 3D inspection and metrology. - Fuqin Deng; Jia Chen; Jianyang Liu; Zhijun Zhang 001; Jiangwen Deng; Kenneth S. M. Fung; Edmund Y. Lam (Image Processing: Machine Vision Applications, 2015)

An INSPECT Measurement System for Moving Objects. - Fuqin Deng; Chang Liu; Wuifung Sze; Jiangwen Deng; Kenneth S. M. Fung; Edmund Y. Lam (IEEE Trans. Instrum. Meas., 2015)