Gate stress effect on low temperature data retention characteristics of split-gate flash memories. - Ling-Chang Hu; An-Chi Kang; Eric Chen; J. R. Shih; Yao-Feng Lin; Kenneth Wu; Ya-Chin King (Microelectron. Reliab., 2005)

A study of Cu/Low-k stress-induced voiding at via bottom and its microstructure effect. - Robin C. J. Wang; Chang-Chun Lee; L. D. Chen; Kenneth Wu; K. S. Chang-Liao (Microelectron. Reliab., 2006)

Supporting Feedback and Assessment of Digital Ink Answers to In-Class Exercises. - Kimberle Koile; Kevin Chevalier; Michel Rbeiz; Adam Rogal; David Singer; Jordan Sorensen; Amanda Smith; Kah Seng Tay; Kenneth Wu (AAAI, 2007)

Cellular Downlink Performance with Covariance-CSIT-Based MIMO Precoding. - Kenneth Wu; Thomas Derham; Patrice Coupé (Wirel. Pers. Commun., 2012)

A new mechanism of signal path charging damage across separated power domain deep N-Well interface. - Yu-Lin Chu; Hsi-Yu Kuo; Sheng-Fu Hsu; Yung-Sheng Tsai; Ming-Yi Wang; Chuan-Li Chang; Bill Kiang; Kenneth Wu (IRPS, 2018)