Decoding Substitution Ciphers by Means of Word Matching with Application to OCR. - George Nagy; Sharad C. Seth; Kent L. Einspahr (IEEE Trans. Pattern Anal. Mach. Intell., 1987)

A Switch-Level Test Generation System. - Kent L. Einspahr; Sharad C. Seth (VLSI Design, 1992)

Clock partitioning for testability. - Kent L. Einspahr; Sharad C. Seth; Vishwani D. Agrawal (Great Lakes Symposium on VLSI, 1993)

A switch-level test generation system for synchronous and asynchronous circuits. - Kent L. Einspahr; Sharad C. Seth (J. Electron. Test., 1995)

Improving Circuit Testability by Clock Control. - Kent L. Einspahr; Sharad C. Seth; Vishwani D. Agrawal (Great Lakes Symposium on VLSI, 1996)

Synthesis for Testability by Two-Clock Control. - Shashank K. Mehta; Kent L. Einspahr; Sharad C. Seth (VLSI Design, 1997)

Synthesis of Sequential Circuits with Clock Control to Improve Testability. - Kent L. Einspahr; Shashank K. Mehta; Sharad C. Seth (Asian Test Symposium, 1998)

A synthesis for testability scheme for finite state machines using clock control. - Kent L. Einspahr; Shashank K. Mehta; Sharad C. Seth (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999)

Exploiting don't cares to enhance functional tests. - Mark W. Weiss; Sharad C. Seth; Shashank K. Mehta; Kent L. Einspahr (ITC, 2000)

Design Verification and Functional Testing of FiniteState Machines. - Mark W. Weiss; Sharad C. Seth; Shashank K. Mehta; Kent L. Einspahr (VLSI Design, 2001)