A Practical Approach to Threshold Test Generation for Error Tolerant Circuits. - Hideyuki Ichihara; Kenta Sutoh; Yuki Yoshikawa; Tomoo Inoue (Asian Test Symposium, 2009)

A Practical Threshold Test Generation for Error Tolerant Application. - Hideyuki Ichihara; Kenta Sutoh; Yuki Yoshikawa; Tomoo Inoue (IEICE Trans. Inf. Syst., 2010)