On Improving Defect Coverage of Stuck-at Fault Tests. - Kohei Miyase; Kenta Terashima; Seiji Kajihara; Xiaoqing Wen; Sudhakar M. Reddy (Asian Test Symposium, 2005)

On Detection of Bridge Defects with Stuck-at Tests. - Kohei Miyase; Kenta Terashima; Xiaoqing Wen; Seiji Kajihara; Sudhakar M. Reddy (IEICE Trans. Inf. Syst., 2008)