Statistical aging under dynamic voltage scaling: A logarithmic model approach. - Jyothi Velamala; Ketul Sutaria; Hirofumi Shimizu; Hiromitsu Awano; Takashi Sato 001; Yu Cao 001 (CICC, 2012)

Physics matters: statistical aging prediction under trapping/detrapping. - Jyothi Bhaskarr Velamala; Ketul Sutaria; Takashi Sato 001; Yu Cao 001 (DAC, 2012)

Hierarchical modeling of Phase Change memory for reliable design. - Zihan Xu; Ketul Sutaria; Chengen Yang; Chaitali Chakrabarti; Yu Cao 001 (ICCD, 2012)

Enhancing the Reliability of STT-RAM through Circuit and System Level Techniques. - Yunus Emre; Chengen Yang; Ketul Sutaria; Yu Cao 001; Chaitali Chakrabarti (SiPS, 2012)

Compact modeling of STT-MTJ for SPICE simulation. - Zihan Xu; Ketul Sutaria; Chengen Yang; Chaitali Chakrabarti; Yu Cao 001 (ESSDERC, 2013)

BTI-Induced Aging under Random Stress Waveforms: Modeling, Simulation and Silicon Validation. - Ketul Sutaria; Athul Ramkumar; Rongjun Zhu; Renju Rajveev; Yao Ma; Yu Cao 001 (DAC, 2014)

Where is the Achilles Heel under Circuit Aging. - Ketul Sutaria; Athul Ramkumar; Rongjun Zhu; Yu Cao 001 (ISVLSI, 2014)

Cross-Layer Modeling and Simulation of Circuit Reliability. - Yu Cao 001; Jyothi Velamala; Ketul Sutaria; Mike Shuo-Wei Chen; Jonathan Ahlbin; Ivan Sanchez Esqueda; Michael Bajura; Michael Fritze (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)

Duty cycle shift under static/dynamic aging in 28nm HK-MG technology. - Ketul B. Sutaria; Pengpeng Ren; Abinash Mohanty; Xixiang Feng; Runsheng Wang; Ru Huang 001; Yu Cao 001 (IRPS, 2015)

RTN in Scaled Transistors for On-Chip Random Seed Generation. - Abinash Mohanty; Ketul B. Sutaria; Hiromitsu Awano; Takashi Sato 001; Yu Cao 001 (IEEE Trans. Very Large Scale Integr. Syst., 2017)

Transistor reliability characterization and modeling of the 22FFL FinFET technology. - Chen-Yi Su; M. Armstrong; Lei Jiang; S. A. Kumar; C. D. Landon; S. Liu; Inanc Meric; K. W. Park; Leif Paulson; K. Phoa; Bernhard Sell; Jihan Standfest; et al. (IRPS, 2018)

Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits. - Ketul B. Sutaria; Jihan Standfest; Inanc Meric; Amirhossein H. Davoody; Swaroop Kumar Namalapuri; Trinadh Mutyala; Supriya P.; Balkaran Gill; Stephen Ramey; Jeffery Hicks (IRPS, 2020)

Q&R On-Chip (QROC): A Unified, Oven-less and Scalable Circuit Reliability Platform. - Ketul B. Sutaria; Minki Cho; Anisur Rahman; Jihan Standfest; Rahul Sharma; Swaroop Kumar Namalapuri; Shiv Gupta; Bahar Ajdari; Ricardo Ascázubi; Balkaran Gill (IRPS, 2022)