A Deep Learning Based Automatic Defect Analysis Framework for In-situ TEM Ion Irradiations. - Mingren Shen; Guanzhao Li; Dongxia Wu; Yudai Yaguchi; Jack C. Haley; Kevin G. Field; Dane Morgan (CoRR, 2021)

Performance, Successes and Limitations of Deep Learning Semantic Segmentation of Multiple Defects in Transmission Electron Micrographs. - Ryan Jacobs; Mingren Shen; Yuhan Liu; Wei Hao; Xiaoshan Li; Ruoyu He; Jacob R. C. Greaves; Donglin Wang; Zeming Xie; Zitong Huang; Chao Wang; Kevin G. Field; et al. (CoRR, 2021)

Accelerating Domain-Aware Electron Microscopy Analysis Using Deep Learning Models with Synthetic Data and Image-Wide Confidence Scoring. - Matthew J. Lynch; Ryan Jacobs; Gabriella Bruno; Priyam Patki; Dane Morgan; Kevin G. Field (CoRR, 2024)

Performance Evaluation of Image Super-Resolution for Cavity Detection in Irradiated Materials. - John Olamofe; Lijun Qian; Kevin G. Field (IEEE Access, 2025)

Predicting Performance of Object Detection Models in Electron Microscopy Using Random Forests. - Ni Li; Ryan Jacobs; Matthew J. Lynch; Vidit Agrawal; Kevin G. Field; Dane Morgan (CoRR, 2025)