Delay Test: The Next Frontier for LSSD Test Systems. - Bernd Könemann; J. Barlow; Paul Chang; R. Gabrielson; C. Goertz; Brion L. Keller; Kevin McCauley; J. Tischer; Vijay S. Iyengar; Barry K. Rosen; T. Williams (ITC, 1992)

Delay test of chip I/Os using LSSD boundary scan. - Pamela S. Gillis; Francis Woytowich; Kevin McCauley; Ulrich Baur (ITC, 1998)

ATPG in practical and non-traditional applications. - Brion L. Keller; Kevin McCauley; Joseph Swenton; James Youngs (ITC, 1998)

Low Overhead Delay Testing of ASICS. - Pamela S. Gillis; Francis Woytowich; Andrew Ferko; Kevin McCauley (ITC, 2004)

Practical Aspects of Delay Testing for Nanometer Chips. - Vivek Chickermane; Brion L. Keller; Kevin McCauley; Anis Uzzaman (Asian Test Symposium, 2005)

Not all Delay Tests Are the Same - SDQL Model Shows True-Time. - Anis Uzzaman; Mick Tegethoff; Bibo Li; Kevin McCauley; Shuji Hamada; Yasuo Sato (ATS, 2006)