Test structure, circuits and extraction methods to determine the radius of infuence of STI and polysilicon pattern density. - Albert H. Chang; Kewei Zuo; Jean Wang; Douglas Yu; Duane S. Boning (ISQED, 2012)

Methodology for analysis of TSV stress induced transistor variation and circuit performance. - Li Yu 009; Wen-Yao Chang; Kewei Zuo; Jean Wang; Douglas Yu; Duane S. Boning (ISQED, 2012)