Front-end of line and middle-of-line time-dependent dielectric breakdown reliability simulator for logic circuits. - Kexin Yang 001; Taizhi Liu; Rui Zhang 048; Dae Hyun Kim 003; Linda Milor (Microelectron. Reliab., 2017)

Analysis of time-dependent dielectric breakdown induced aging of SRAM cache with different configurations. - Rui Zhang 048; Taizhi Liu; Kexin Yang 001; Linda Milor (Microelectron. Reliab., 2017)

Optimal Accelerated Test Regions for Time- Dependent Dielectric Breakdown Lifetime Parameters Estimation in FinFET Technology. - Kexin Yang 001; Rui Zhang 048; Taizhi Liu; Dae Hyun Kim 003; Linda Milor (DCIS, 2018)

Estimation of the Optimal Accelerated Test Region for FinFET SRAMs Degraded by Front-End and Back-End Wearout Mechanisms. - Rui Zhang 048; Kexin Yang 001; Taizhi Liu; Linda Milor (DCIS, 2018)

Circuit-level reliability simulator for front-end-of-line and middle-of-line time-dependent dielectric breakdown in FinFET technology. - Kexin Yang 001; Taizhi Liu; Rui Zhang 048; Linda Milor (VTS, 2018)

A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both Traditional CMOS and FinFET Technology. - Kexin Yang 001; Taizhi Liu; Rui Zhang 048; Linda Milor (IEEE Trans. Very Large Scale Integr. Syst., 2018)

Reliability and Accelerated Testing of 14nm FinFET Ring Oscillators. - Shu-Han Hsu; Kexin Yang 001; Linda Milor (DCIS, 2019)

Identification of Failure Modes for Circuit Samples with Confounded Causes of Failure. - Shu-Han Hsu; Ying-Yuan Huang; Kexin Yang 001; Linda Milor (IOLTS, 2019)

Machine Learning for Detection of Competing Wearout Mechanisms. - Shu-Han Hsu; Kexin Yang 001; Linda Milor (IRPS, 2019)

Impact of Front-End Wearout Mechanisms on the Performance of a Ring Oscillator-Based Thermal Sensor. - Rui Zhang 048; Kexin Yang 001; Taizhi Liu; Linda Milor (IWASI, 2019)

Inverse Design of FinFET SRAM Cells. - Rui Zhang 048; Zhaocheng Liu; Kexin Yang 001; Taizhi Liu; Wenshan Cai; Linda Milor (IRPS, 2020)

Optimal Accelerated Test Framework for Time-Dependent Dielectric Breakdown Lifetime Parameter Estimation. - Yi-Da Wu; Kexin Yang 001; Shu-Han Hsu; Linda Milor (IEEE Trans. Very Large Scale Integr. Syst., 2020)

SRAM Stability Analysis and Performance-Reliability Tradeoff for Different Cache Configurations. - Rui Zhang 048; Taizhi Liu; Kexin Yang 001; Chang-Chih Chen; Linda Milor (IEEE Trans. Very Large Scale Integr. Syst., 2020)

A Comprehensive Framework for Analysis of Time-Dependent Performance-Reliability Degradation of SRAM Cache Memory. - Rui Zhang 048; Kexin Yang 001; Zhaocheng Liu; Taizhi Liu; Wenshan Cai; Linda Milor (IEEE Trans. Very Large Scale Integr. Syst., 2021)

CacheEM: For Reliability Analysis on Cache Memory Aging Due to Electromigration. - Rui Zhang 048; Taizhi Liu; Kexin Yang 001; Linda Milor (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)