VirtualScan: A New Compressed Scan Technology for Test Cost Reduction. - Laung-Terng Wang; Khader S. Abdel-Hafez; Shianling Wu; Xiaoqing Wen; Hiroshi Furukawa; Fei-Sheng Hsu; Shyh-Horng Lin; Sen-Wei Tsai (ITC, 2004)

UltraScan: using time-division demultiplexing/multiplexing (TDDM/TDM) with VirtualScan for test cost reduction. - Laung-Terng Wang; Khader S. Abdel-Hafez; Xiaoqing Wen; Boryau Sheu; Shianling Wu; Shyh-Horng Lin; Ming-Tung Chang (ITC, 2005)

A New ATPG Method for Efficient Capture Power Reduction During Scan Testing. - Xiaoqing Wen; Seiji Kajihara; Kohei Miyase; Tatsuya Suzuki; Kewal K. Saluja; Laung-Terng Wang; Khader S. Abdel-Hafez; Kozo Kinoshita (VTS, 2006)

State of the art low capture power methodology. - Swapnil Bahl; Roberto Mattiuzzo; Shray Khullar; Akhil Garg 001; S. Graniello; Khader S. Abdel-Hafez; Salvatore Talluto 001 (ITC, 2011)

Comprehensive Power-Aware ATPG Methodology for Complex Low-Power Designs. - Khader S. Abdel-Hafez; Michael Dsouza; Likith Kumar Manchukonda; Elddie Tsai; Karthikeyan Natarajan; Ting-Pu Tai; Wenhao Hsueh; Smith Lai (ITC, 2022)