Frequency-based BIST for analog circuit testin. - Khaled Saab 001; Bozena Kaminska; Bernard Courtois; Marcelo Lubaszewski (VTS, 1995)

LIMSoft: Automated Tool for Design and Test Integration of Analog Circuits. - Naim Ben-Hamida; Khaled Saab 001; David Marche; Bozena Kaminska; Guy Quesnel (ITC, 1996)

A perturbation based fault modeling and simulation for mixed-signal circuits. - Naim Ben-Hamida; Khaled Saab 001; David Marche; Bozena Kaminska (Asian Test Symposium, 1997)

Closing the gap between analog and digital. - Khaled Saab 001; Naim Ben-Hamida; Bozena Kaminska (DAC, 2000)

Parametric Fault Simulation and Test Vector Generation. - Khaled Saab 001; Naim Ben-Hamida; Bozena Kaminska (DATE, 2000)

Closing the gap between analog and digital testing. - Khaled Saab 001; Naim Ben-Hamida; Bozena Kaminska (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2001)