Berkeley reliability tools-BERT. - Robert H. Tu; Elyse Rosenbaum; Wilson Y. Chan; Chester C. Li; Eric R. Minami; Khandker N. Quader; Ping K. Ko; Chenming Hu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1993)

Hot-carrier-reliability design guidelines for CMOS logic circuits. - Khandker N. Quader; Eric R. Minami; Wei-Jen Huang; Ping K. Ko; Chenming Hu (IEEE J. Solid State Circuits, 1994)

A 286 mm2 256 Mb DRAM with ×32 both-ends DQ. - Yohji Watanabe; Ring Wong; Toshiaki Kirihata; Daisuke Kato; John K. DeBrosse; Takahiko Rara; Munehiro Yoshida; Rideo Mukai; Khandker N. Quader; Takeshi Nagai; Peter Poechmueller; Peter Pfefferl; et al. (IEEE J. Solid State Circuits, 1996)