MBIST Supported Multi Step Trim for Reliable eMRAM Sensing. - Jongsin Yun; Benoit Nadeau-Dostie; Martin Keim; Lori Schramm; Cyrille Dray; El Mehdi Boujamaa; Khushal Gelda (ITC, 2020)

Transitioning eMRAM from Pilot Project to Volume Production. - Cyrille Dray; Khushal Gelda; Benoit Nadeau-Dostie; Wei Zou; Luc Romain; Jongsin Yun; Harshitha Kodali; Lori Schramm; Martin Keim (ITC, 2023)

A Novel BIST Method for Multi-Port Register Files. - Andy Chen; Vianney Choserot; Munish Kumar; Khushal Gelda; Shreyas Pramod Dixit; Wei Zou; Jongsin Yun; Harshitha Kodali; Albert Au; Lori Schramm; Martin Keim (ETS, 2025)