3D Defect Localization on Exothermic Faults within Multi-Layered Structures Using Lock-In Thermography: An Experimental and Numerical Approach. - Ji-Yong Bae; Kye-Sung Lee; Hwan Hur; Ki-Hwan Nam; Sukju Jung; Ah-Yeong Lee; Ki Soo Chang; Geon-Hee Kim; Ghiseok Kim (Sensors, 2017)

Laser Scanning Confocal Thermoreflectance Microscope for the Backside Thermal Imaging of Microelectronic Devices. - Donguk Kim; Chan Bae Jeong; Jung Dae Kim; Kye-Sung Lee; Hwan Hur; Ki-Hwan Nam; Geon-Hee Kim; Ki Soo Chang (Sensors, 2017)

Backside Thermal Fault Localization Using Laser Scanning Confocal Thermoreflectance Microscopy Based on Auto-Balanced Detection. - Donguk Kim; Jung Dae Kim; Ilkyu Han; Chan Bae Jeong; Kye-Sung Lee; Hwan Hur; Ki-Hwan Nam; Ji-Yong Bae; I Jong Kim; Ki Soo Chang (IEEE Trans. Instrum. Meas., 2020)