Fault-Tolerant FPGA with Column-Based Redundancy and Power Gating Using RRAM. - Kibum Lee; S. Simon Wong (IEEE Trans. Computers, 2017)

The first study of 10nm-class backside defect using Co-Routine based ETL in DRAM. - Taesu Shin; Kibum Lee (ISOCC, 2022)

Automation methodology of local defocus monitoring on fixed chips in semiconductor fabrication. - Taesoo Shin; Seulgi Ok; Kibum Lee; Sungwook Hwang (ICEIC, 2023)