Code-width testing-based compact ADC BIST circuit. - Dongmyung Lee; Kwisung Yoo; Kicheol Kim; Gunhee Han; Sungho Kang (IEEE Trans. Circuits Syst. II Express Briefs, 2004)

A New Low Power Test Pattern Generator for BIST Architecture. - Kicheol Kim; DongSub Song; Incheol Kim; Sungho Kang (IEICE Trans. Electron., 2005)

TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure. - Youbean Kim; Dongsup Song; Kicheol Kim; Incheol Kim; Sungho Kang (ATS, 2006)

A New Analog-to-Digital Converter BIST Considering a Transient Zone. - Incheol Kim; Kicheol Kim; Youbean Kim; HyeonUk Son; Sungho Kang 001 (IEICE Trans. Electron., 2007)

A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals. - Youbean Kim; Kicheol Kim; Incheol Kim; Sungho Kang (IEICE Trans. Electron., 2008)

A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters. - Kicheol Kim; Youbean Kim; Incheol Kim; HyeonUk Son; Sungho Kang 001 (IEICE Trans. Electron., 2008)

A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST. - Youbean Kim; Kicheol Kim; Incheol Kim; Hyunwook Son; Sungho Kang (IEICE Trans. Inf. Syst., 2008)

Systematic Analysis of Defect-Specific Code Abstraction for Neural Program Repair. - Kicheol Kim; Misoo Kim; Eunseok Lee 001 (APSEC, 2022)

Multi-objective Optimization-based Bug-fixing Template Mining for Automated Program Repair. - Misoo Kim; Youngkyoung Kim; Kicheol Kim; Eunseok Lee 001 (ASE, 2022)

Tweezers: A Framework for Security Event Detection via Event Attribution-centric Tweet Embedding. - Jian Cui; Hanna Kim; Eugene Jang; Dayeon Yim; Kicheol Kim; Yongjae Lee; Jin-Woo Chung; Seungwon Shin 001; Xiaojing Liao (NDSS, 2025)