Physics-informed AI Accelerated Retention Analysis of Ferroelectric Vertical NAND: From Day-Scale TCAD to Second-Scale Surrogate Model. - Gyujun Jeong; Sungwon Cho; Minji Shon; Namhoon Kim; Woohyun Hwang; Kwangyou Seo; Suhwan Lim; Wanki Kim; Daewon Ha; Prasanna Venkatesan Ravindran; Kihang Youn; Ram Cherukuri; et al. (CoRR, 2026)