Time Dependent Variability in Advanced FinFET Technology for End-of-Lifetime Reliability Prediction. - Hai Jiang 005; Jinju Kim; Kihyun Choi; Hyewon Shim; Hyunchul Sagong; Junekyun Park; Hwasung Rhee; Euncheol Lee (IRPS, 2021)

Middle-of-the-Line Reliability Characterization of Recessed-Diffusion-Contact Adopted sub-5nm Logic Technology. - Seongkyung Kim; Ukjin Jung; Seungjin Choo; Kihyun Choi; Tae-Jin Chung; Shin-Young Chung; Euncheol Lee; Juhun Park; Deokhan Bae; Myungyoon Um (IRPS, 2022)

Reverse Body Bias Dependence of HCI Reliability in Advanced FinFET. - Md Iqbal Mahmud; Rakesh Ranjan; Ki-Don Lee; Pavitra Ramadevi Perepa; Caleb Dongkyun Kwon; Seungjin Choo; Kihyun Choi (IRPS, 2022)