Testable design of large random access memories. - Kewal K. Saluja; Kim Thang Le (Integr., 1984)

A Novel Approach for Testing Memories Using a Built-In Self Testing Technique. - Kim T. Le; Kewal K. Saluja (ITC, 1986)

A Heuristic Measure to Maximize Detected Faults per Test. - Kim T. Le; Kewal K. Saluja (J. Electron. Test., 1998)

Reduction of Target Fault List for Crosstalk-Induced Delay Faults by using Layout Constraints. - Keith J. Keller; Hiroshi Takahashi; Kim T. Le; Kewal K. Saluja; Yuzo Takamatsu (Asian Test Symposium, 2002)

A Concurrent Fault Simulation for Crosstalk Faults in Sequential Circuits. - Marong Phadoongsidhi; Kim T. Le; Kewal K. Saluja (Asian Test Symposium, 2002)

A method for reducing the target fault list of crosstalk faults in synchronous sequential circuits. - Hiroshi Takahashi; Keith J. Keller; Kim T. Le; Kewal K. Saluja; Yuzo Takamatsu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005)

Test Time Reduction to Test for Path-Delay Faults using Enhanced Random-Access Scan. - Kim T. Le; Dong Hyun Baik; Kewal K. Saluja (VLSI Design, 2007)

Privacy Assurances in Multiple Data-Aggregation Transactions. - Kim T. Le; Parmesh Ramanathan; Kewal K. Saluja (ICISC, 2013)

Privacy Assurance in Data-Aggregation for Multiple MAX Transactions. - Kim T. Le; Parmesh Ramanathan; Kewal K. Saluja (COMPSAC Workshops, 2015)