Targeted Custom High-Voltage Stress Patterns on Automotive Designs. - Saidapet Ramesh; Kristofor Dickson; Akshay Jaiswal; Robert Marchese; Kiran Sunny Thota (VTS, 2023)

A Fast, Statistical, Machine-learning Approach for Automotive Semiconductor Test Reduction. - Mehul D. Shroff; Nguyen Nguyen; Kiran Sunny Thota (ITC, 2024)