Test research in Japan. - Hideo Fujiwara; Yuzo Takamatsu; Takashi Nanya; Teruhiko Yamada; Hideo Tamamoto; Kiyoshi Furuya (IEEE Des. Test, 1988)

Two-Pattern Test Capabilities of Autonomous TPG Circuits. - Kiyoshi Furuya; Edward J. McCluskey (ITC, 1991)

Design of Autonomous TPG Circuits for Use in Two-Pattern Testing. - Kiyoshi Furuya; Seiji Seki; Edward J. McCluskey (IEICE Trans. Inf. Syst., 1995)

Stuck-Open Fault Detectabilities of Various TPG Circuits for Use in Two-Pattern Testing. - Kiyoshi Furuya; Susumu Yamazaki; Masayuki Sato (IEICE Trans. Inf. Syst., 1995)

Foreword. - Kiyoshi Furuya (IEICE Trans. Inf. Syst., 2004)

A consideration of blind source separation using wavelet transform. - Noriyuki Hirai; Hiroki Matsumoto; Toshihiro Furukawa; Kiyoshi Furuya (ISCAS (6), 2005)