New Capabilities of OBIRCH Method for Fault Localization and Defect Detection. - Kiyoshi Nikawa; Shoji Inoue (Asian Test Symposium, 1997)

Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method. - Kiyoshi Nikawa; Shoji Inoue; Kazuyuki Morimoto; Shinya Sone (Asian Test Symposium, 1999)

How long can we succeed using the OBIRCH and its derivatives? - Kiyoshi Nikawa (ITC, 2004)

New Approach of Laser-SQUID Microscopy to LSI Failure Analysis. - Kiyoshi Nikawa; Shoji Inoue; Tatsuoki Nagaishi; Toru Matsumoto 002; Katsuyoshi Miura; Koji Nakamae (IEICE Trans. Electron., 2009)

Laser THz emission microscope as a novel tool for LSI failure analysis. - Masatsugu Yamashita; Chiko Otani; Sunmi Kim; Hironaru Murakami; Masayoshi Tonouchi; Toru Matsumoto 002; Yoshihiro Midoh; Katsuyoshi Miura; Koji Nakamae; Kiyoshi Nikawa (Microelectron. Reliab., 2009)

The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization. - Kiyoshi Nikawa; Masatsugu Yamashita; Toru Matsumoto 002; Katsuyoshi Miura; Yoshihiro Midoh; Koji Nakamae (Microelectron. Reliab., 2011)

Observation of impurity diffusion defect in IGBT using a laser terahertz emission microscope technique. - Yasunori Goto; Toru Matsumoto 002; Kiyoshi Nikawa (Microelectron. Reliab., 2013)