A Hybrid Mesh Generation Method for Two and Three Dimensional Simulation of Semiconductor Processes and Devices. - Dan Wake; Klas Lilja; Victor Moroz (IMR, 1998)

Single-event effects in advanced CMOS technologies - Analysis and mitigation. - Marek Turowski; Klas Lilja (MIXDES, 2015)

Clear: cross-layer exploration for architecting resilience combining hardware and software techniques to tolerate soft errors in processor cores. - Eric Cheng; Shahrzad Mirkhani; Lukasz G. Szafaryn; Chen-Yong Cher; Hyungmin Cho; Kevin Skadron; Mircea R. Stan; Klas Lilja; Jacob A. Abraham; Pradip Bose; Subhasish Mitra (DAC, 2016)

Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights. - Eric Cheng; Jacob A. Abraham; Pradip Bose; Alper Buyuktosunoglu; Keith A. Campbell; Deming Chen; Chen-Yong Cher; Hyungmin Cho; Binh Q. Le; Klas Lilja; Shahrzad Mirkhani; Kevin Skadron; et al. (ICCD, 2017)

Tolerating Soft Errors in Processor Cores Using CLEAR (Cross-Layer Exploration for Architecting Resilience). - Eric Cheng; Shahrzad Mirkhani; Lukasz G. Szafaryn; Chen-Yong Cher; Hyungmin Cho; Kevin Skadron; Mircea R. Stan; Klas Lilja; Jacob A. Abraham; Pradip Bose; Subhasish Mitra (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018)

CLEAR Cross-Layer Resilience: A Retrospective. - Eric Cheng; Hyungmin Cho; Shahrzad Mirkhani; Lukasz G. Szafaryn; Jacob A. Abraham; Pradip Bose; Chen-Yong Cher; Klas Lilja; Kevin Skadron; Mircea Stan; Subhasish Mitra (IEEE Des. Test, 2025)