An Approach to Chip-Internal Current Monitoring and Measurement Using an Electron Beam Tester. - Klaus Helmreich; Peter Nagel; Werner Wolz; Klaus D. Müller-Glaser (ITC, 1991)

DRC-based Selection of Optimal Probing Points for Chip-Internal Measurements. - R. Scharf; Claus Kuntzsch; Klaus Helmreich; Werner Wolz; Klaus D. Müller-Glaser (ITC, 1992)

Virtual Test of Noise and Jitter Parameters. - Klaus Helmreich; G. Reinwardt (ITC, 1996)

Test path simulation and characterisation. - Klaus Helmreich (ITC, 2001)

Mixed-signal test development using open standard modeling and description languages. - Ping Lu 013; Daniel Glaser; Gürkan Uygur; Susanne Weichslgartner; Klaus Helmreich; A. Lechner (BMAS, 2009)

A novel approach to entirely integrate Virtual Test into test development flow. - Ping Lu 013; Daniel Glaser; Gürkan Uygur; Klaus Helmreich (DATE, 2009)

A Simple and Low-Cost Technique to Measure the Magnetic Susceptibility of Ferrofluids. - Angelika S. Thalmayer; Keyu Xiao; Maximilian Lübke; Dmitry Borin; Stefan Odenbach; Harald Unterweger; Klaus Helmreich; Georg Fischer 001 (SENSORS, 2023)