Automatic test pattern generation for delay defects using timed characteristic functions. - Shin-Yann Ho; Shuo-Ren Lin; Ko-Lung Yuan; Chien-Yen Kuo; Kuan-Yu Liao; Jie-Hong R. Jiang; Chien-Mo James Li (ICCAD, 2013)

Encoding multi-valued functions for symmetry. - Ko-Lung Yuan; Chien-Yen Kuo; Jie-Hong R. Jiang; Meng-Yen Li (ICCAD, 2013)