Statistical SRAM analysis for yield enhancement. - Paul Zuber; Miguel Miranda; Petr Dobrovolný; Koen van der Zanden; Jong-Hoon Jung (DATE, 2010)

Circuit Design for Bias Compatibility in Novel FinFET-Based Floating-Body RAM. - Pavel Poliakov; Ankur Anchlia; Marie Garcia Bardon; Bram Rooseleer; Bart De Wachter; Nadine Collaert; Koen van der Zanden; Wim Dehaene; Diederik Verkest; Miguel Corbalan Miranda (IEEE Trans. Circuits Syst. II Express Briefs, 2010)