ATREX : Design for Testability System for Mega Gate LSIs. - Michiaki Emori; Junko Kumagai; Koichi Itaya; Takashi Aikyo; Tomoko Anan; Junichi Niimi (Asian Test Symposium, 1997)

BIST-Aided Scan Test - A New Method for Test Cost Reduction. - Takahisa Hiraide; Kwame Osei Boateng; Hideaki Konishi; Koichi Itaya; Michiaki Emori; Hitoshi Yamanaka; Takashi Mochiyama (VTS, 2003)