A Consistent Scan Design System for Large-Scale ASICs. - Yoshihiro Konno; Kazushi Nakamura; Tatsushige Bitoh; Koji Saga; Seiken Yano (Asian Test Symposium, 1996)

An Application of Partial Scan Techniques to a High-End System LSI Design. - Toshinobu Ono; Akira Kozawa; Takashi Kimura; Yoshihiro Konno; Koji Saga (Asian Test Symposium, 2001)