A 123μW standby power technique with EM-tolerant 1.8V I/O NMOS power switch in 28nm HKMG technology. - Kazuki Fukuoka; Ryo Mori; A. Kato; Motoshige Igarashi; Koji Shibutani; T. Yamaki; Shinji Tanaka; Koji Nii; Sadayuki Morita; Takao Koike; Noriaki Sakamoto (CICC, 2012)

Assessment of reliability impact on GHz processors with moderate overdrive. - Mitsuhiko Igarashi; Hideki Aono; Hideaki Abe; Koji Shibutani; Kan Takeuchi (ISQED, 2014)

An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk CMOS technology. - Mitsuhiko Igarashi; Kan Takeuchi; Takeshi Okagaki; Koji Shibutani; Hiroaki Matsushita; Koji Nii (ESSCIRC, 2015)

FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs. - Kan Takeuchi; Masaki Shimada; Takeshi Okagaki; Koji Shibutani; Koji Nii; Fumio Tsuchiya (ESSCIRC, 2016)

NBTI/PBTI separated BTI monitor with 4.2x sensitivity by standard cell based unbalanced ring oscillator. - Mitsuhiko Igarashi; Yoshio Takazawa; Yasumasa Tsukamoto; Kan Takeuchi; Koji Shibutani (A-SSCC, 2017)

A Fully Standard-Cell Based On-Chip BTI and HCI Monitor with 6.2x BTI sensitivity and 3.6x HCI sensitivity at 7 nm Fin-FET Process. - Mitsuhiko Igarashi; Yuuki Uchida; Yoshio Takazawa; Yasumasa Tsukamoto; Koji Shibutani; Koji Nii (A-SSCC, 2018)

Study of impact of BTI's local layout effect including recovery effect on various standard-cells in 10nm FinFET. - Mitsuhiko Igarashi; Yuuki Uchida; Yoshio Takazawa; Yasumasa Tsukamoto; Koji Shibutani; Koji Nii (IRPS, 2018)

Wear-out stress monitor utilising temperature and voltage sensitive ring oscillators. - Kan Takeuchi; Masaki Shimada; Takeshi Okagaki; Koji Shibutani; Koji Nii; Fumio Tsuchiya (IET Circuits Devices Syst., 2018)

Study of Local BTI Variation and its Impact on Logic Circuit and SRAM in 7 nm Fin-FET Process. - Mitsuhiko Igarashi; Yuuki Uchida; Yoshio Takazawa; Makoto Yabuuchi; Yasumasa Tsukamoto; Koji Shibutani (IRPS, 2019)

Experimental Implementation of 8.9Kgate Stress Monitor in 28nm MCU Along with Safety Software Library for IoT Device Maintenance. - Kan Takeuchi; Masaki Shimada; Shinya Konishi; Daisuke Oshida; Naoya Ota; Takashi Yasumasu; Koji Shibutani; Tomohiro Iwashita; Tetsuya Kokubun; Fumio Tsuchiya (IRPS, 2019)

An Analysis of Local BTI Variation with Ring-Oscillator in Advanced Processes and Its Impact on Logic Circuit and SRAM. - Mitsuhiko Igarashi; Yuuki Uchida; Yoshio Takazawa; Makoto Yabuuchi; Yasumasa Tsukamoto; Koji Shibutani; Kazutoshi Kobayashi (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2021)