Read static noise margin aging model considering SBD and BTI effects for FinFET SRAMs. - Kolsoom Mehrabi; Behzad Ebrahimi; Roohollah Yarmand; Ali Afzali-Kusha; Hamid Mahmoodi (Microelectron. Reliab., 2016)

Low-power data encoding/decoding for energy-efficient static random access memory design. - Ghasem Pasandi; Kolsoom Mehrabi; Behzad Ebrahimi; Sied Mehdi Fakhraei; Ali Afzali-Kusha; Massoud Pedram (IET Circuits Devices Syst., 2019)