Differential Fault Analysis Attack Resistant Architectures for the Advanced Encryption Standard. - Mark G. Karpovsky; Konrad J. Kulikowski; Alexander Taubin (CARDIS, 2004)

Robust Protection against Fault-Injection Attacks on Smart Cards Implementing the Advanced Encryption Standard. - Mark G. Karpovsky; Konrad J. Kulikowski; Alexander Taubin (DSN, 2004)

Delay Insensitive Encoding and Power Analysis: A Balancing Act. - Konrad J. Kulikowski; Ming Su; Alexander B. Smirnov; Alexander Taubin; Mark G. Karpovsky; Daniel MacDonald (ASYNC, 2005)

Automated Design of Cryptographic Devices Resistant to Multiple Side-Channel Attacks. - Konrad J. Kulikowski; Alexander B. Smirnov; Alexander Taubin (CHES, 2006)

Fault Attack Resistant Cryptographic Hardware with Uniform Error Detection. - Konrad J. Kulikowski; Mark G. Karpovsky; Alexander Taubin (FDTC, 2006)

DPA on Faulty Cryptographic Hardware and Countermeasures. - Konrad J. Kulikowski; Mark G. Karpovsky; Alexander Taubin (FDTC, 2006)

Power Attacks on Secure Hardware Based on Early Propagation of Data. - Konrad J. Kulikowski; Mark G. Karpovsky; Alexander Taubin (IOLTS, 2006)

Robust codes and robust, fault-tolerant architectures of the Advanced Encryption Standard. - Konrad J. Kulikowski; Mark G. Karpovsky; Alexander Taubin (J. Syst. Archit., 2007)

Power Balanced Gates Insensitive to Routing Capacitance Mismatch. - Konrad J. Kulikowski; Vyas Venkataraman; Zhen Wang 001; Alexander Taubin (DATE, 2008)

Comparative Analysis of Robust Fault Attack Resistant Architectures for Public and Private Cryptosystems. - Konrad J. Kulikowski; Zhen Wang 001; Mark G. Karpovsky (FDTC, 2008)

Asynchronous balanced gates tolerant to interconnect variability. - Konrad J. Kulikowski; Vyas Venkataraman; Zhen Wang 001; Alexander Taubin; Mark G. Karpovsky (ISCAS, 2008)

Replacing linear Hamming codes by robust nonlinear codes results in a reliability improvement of memories. - Zhen Wang 001; Mark G. Karpovsky; Konrad J. Kulikowski (DSN, 2009)

Design of Memories with Concurrent Error Detection and Correction by Nonlinear SEC-DED Codes. - Zhen Wang 001; Mark G. Karpovsky; Konrad J. Kulikowski (J. Electron. Test., 2010)

Robust correction of repeating errors by non-linear codes. - Konrad J. Kulikowski; Mark G. Karpovsky (IET Commun., 2011)