Time-to-Digital Converter Architectures Using Two Oscillators with Different Frequencies. - Kosuke Machida; Uni Ozawa; Yudai Abe; Haruo Kobayashi 001 (ATS, 2018)

Low-Distortion One-Tone and Two-Tone Signal Generation Using AWG Over Full Nyquist Region. - Tomonori Yanagida; Shohei Shibuya; Kosuke Machida; Koji Asami; Haruo Kobayashi 001 (ITC-Asia, 2018)

Group delay measurement of frequency down-converter devices using chirped RF modulated signal. - Peter Sarson; Tomonori Yanagida; Kosuke Machida (VTS, 2018)

Measuring Group Delay of Frequency Downconverter Devices Using a Chirped RF Modulated Signal. - Peter Sarson; Tomonori Yanagida; Kosuke Machida (J. Electron. Test., 2018)

A Distortion Shaping Technique to Equalize Intermodulation Distortion Performance of Interpolating Arbitrary Waveform Generators in Automated Test Equipment. - Peter Sarson; Tomonori Yanagida; Shohei Shibuya; Kosuke Machida; Haruo Kobayashi 001 (J. Electron. Test., 2018)

Evaluation of Null Method for Operational Amplifier Short-Time Testing. - Riho Aoki; Keno Sato; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Shogo Katayama; Yuto Sasaki; Kosuke Machida; Takayuki Nakatani; Jianlong Wang; Anna Kuwana; Kazumi Hatayama; et al. (ASICON, 2019)

Fine Time Resolution TDC Architectures -Integral and Delta-Sigma Types. - Haruo Kobayashi 001; Kosuke Machida; Yuto Sasaki; Yusuke Osawa; Pengfei Zhang; Lei Sha; Yuki Ozawa; Anna Kuwana (ASICON, 2019)

Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion. - Yuto Sasaki; Kosuke Machida; Riho Aoki; Shogo Katayama; Takayuki Nakatani; Jianlong Wang; Keno Sato; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Anna Kuwana; Kazumi Hatayama; et al. (ITC-Asia, 2019)

Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing. - Yukiko Shibasaki; Koji Asami; Anna Kuwana; Kosuke Machida; Yuanyang Du; Akemi Hatta; Kazuyoshi Kubo; Haruo Kobayashi 001 (ITC-Asia, 2019)