A Method of Test Generation fo Path Delay Faults Using Stuck-at Fault Test Generation Algorithms. - Satoshi Ohtake; Kouhei Ohtani; Hideo Fujiwara (DATE, 2003)

A defect level monitor of resistive open defect at interconnects in 3D ICs by injected charge volume. - Kouhei Ohtani; Naho Osato; Masaki Hashizume; Hiroyuki Yotsuyanagi; Shyue-Kung Lu (ISCIT, 2017)