22-nm Data Backup SRAM Using 3.3V IO MOSs with Ultralow-Voltage-Drop Erasure Technique for Secure IoT Applications. - Daiki Kitagata; Shunya Nagata; Kouji Satou; Daisuke Nakamura; Koji Tanaka; Miki Tanaka (A-SSCC, 2024)

An Area-Efficient PVT-Dependent Adaptive Assist Termination Technique with SNM Detector for High Density SRAM. - Shunya Nagata; Daiki Kitagata; Kouji Satou; Daisuke Nakamura; Koji Tanaka; Miki Tanaka; Haruyuki Okuda; Kenichiro Takiguchi (A-SSCC, 2024)