Repair Yield Simulation with Iterative Critical Area Analysis for Different Types of Failure. - Yuichi Hamamura; Kazunori Nemoto; Takaaki Kumazawa; Hisafumi Iwata; Kousuke Okuyama; Shiro Kamohara; Aritoshi Sugimoto (DFT, 2002)

Modeling of NBTI saturation effect and its impact on electric field dependence of the lifetime. - Hideki Aono; Eiichi Murakami; Kousuke Okuyama; A. Nishida; Masataka Minami; Y. Ooji; Katsuhiko Kubota (Microelectron. Reliab., 2005)

Energy-conservation SNS that is associated with power consumption real data and twitter. - Kousuke Okuyama; Kohei Saito; Yoshitaka Kato; Keisuke Kobayashi; Yasushi Nakauchi (SII, 2012)