Gate Oxide Reliability Studies of Commercial 1.2 kV 4H-SiC Power MOSFETs. - Tianshi Liu; Shengnan Zhu; Susanna Yu; Diang Xing; Arash Salemi; Minseok Kang; Kristen Booth; Marvin H. White; Anant K. Agarwal (IRPS, 2020)

Threshold Voltage Instability of Commercial 1.2 kV SiC Power MOSFETs. - Susanna Yu; Tianshi Liu; Shengnan Zhu; Diang Xing; Arash Salemi; Minseok Kang; Kristen Booth; Marvin H. White; Anant K. Agarwal (IRPS, 2020)