Photoluminescence Characterisation of High Current Density Resonant Tunnelling Diodes for Terahertz Applications. - Kristof J. P. Jacobs; Benjamin J. Stevens; Richard A. Hogg (IEICE Trans. Electron., 2016)

Lock-in thermal laser stimulation for non-destructive failure localization in 3-D devices. - Kristof J. P. Jacobs; T. Wang; Michele Stucchi; Mario Gonzalez; Kris Croes; Ingrid De Wolf; Eric Beyne (Microelectron. Reliab., 2017)

Thermal source separation for 3D defect localization using independent component analysis (ICA) from time-resolved temperature response (TRTR). - Michael Kögel; Sebastian Brand 001; Christian Große; Kristof J. P. Jacobs; Ingrid De Wolf; Frank Altmann (CASE, 2021)

Localization of Electrical Defects in Hybrid Bonding Interconnect Structures by Scanning Photocapacitance Microscopy. - Kristof J. P. Jacobs; Michele Stucchi; Eric Beyne (IEEE Trans. Instrum. Meas., 2021)