Transient latch-up: experimental analysis and device simulation. - S. Bargstädt-Franke; Wolfgang Stadler; Kai Esmark; Martin Streibl; Krzysztof Domanski; Horst A. Gieser; Heinrich Wolf; Waclaw Bala (Microelectron. Reliab., 2005)

Physical fundamentals of external transient latch-up and corrective actions. - Krzysztof Domanski; B. Póltorak; S. Bargstädt-Franke; Wolfgang Stadler; Waclaw Bala (Microelectron. Reliab., 2006)

SCR operation mode of diode strings for ESD protection. - Ulrich Glaser; Kai Esmark; Martin Streibl; Christian Russ; Krzysztof Domanski; Mauro Ciappa; Wolfgang Fichtner (Microelectron. Reliab., 2007)

Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology. - Michael Heer; Krzysztof Domanski; Kai Esmark; Ulrich Glaser; Dionyz Pogany; Erich Gornik; Wolfgang Stadler (Microelectron. Reliab., 2009)

Qucs-based development of an energy harvester compact model. - Daniel Tomaszewski; Krzysztof Domanski; Piotr Prokaryn (MIXDES, 2015)

Electrical characterization of different types of transistors fabricated in VeSTIC process. - Grzegorz Gluszko; Daniel Tomaszewski; Krzysztof Domanski (MIXDES, 2017)

Latch-up in FinFET technologies. - Krzysztof Domanski (IRPS, 2018)

An Effect of Device Topology in VeSTIC Process on Logic Circuit Operation A Study Based on Ring Oscillator Operation Analysis. - Daniel Tomaszewski; Krzysztof Domanski; Grzegorz Gluszko; Andrzej Sierakowski; Dariusz Szmigiel (MIXDES, 2018)