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Conductive Atomic Force Microscopy - Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface's Electrical Properties. - Andrzej Sikora; Krzysztof Gajewski; Dominik Badura; Bartosz Pruchnik; Tomasz Piasecki; Kamil Raczkowski; Teodor P. Gotszalk (Sensors, 2024)