Practical random sampling of potential defects for analog fault simulation. - Stephen Sunter; Krzysztof Jurga; Peter Dingenen; Ronny Vanhooren (ITC, 2014)

Using Mixed-Signal Defect Simulation to Close the Loop Between Design and Test. - Stephen Sunter; Krzysztof Jurga; Andrew Laidler (IEEE Trans. Circuits Syst. I Regul. Pap., 2016)

Measuring mixed-signal test stimulus quality. - Krzysztof Jurga; Stephen Sunter (ETS, 2018)

Automated Observability Analysis for Mixed-Signal Circuits. - Stephen Sunter; Krzysztof Jurga (VTS, 2021)

Diagnosis of intermittent faults and corresponding algorithm development beyond 5nm technologies. - Jaehoon Lee; Hyeonuk Son; Seohyun Kang; Dahyun Kang; Dongkwan Han; Jongsin Yun; Artur Pogiel; Etienne Racine; Krzysztof Jurga; Lori Schramm; Martin Keim (ITC, 2024)

Digital Scan and ATPG for Analog Circuits. - Stephen Sunter; Krzysztof Jurga (ITC, 2024)